گزارش نهایی پروژه تحقیقاتی ملی ارزیابی مقاومت ژنوتیپهای پیشرفته و امیدبخش گندم نسبت به بیماری سپتوریوز برگ در شرایط مزرعه ای و گلخانه ای

Septoria leaf blotch is one of the most important diseases of wheat in the world that causes wheat yield loss. Using resistant cultivars is the most effective, economic and environmentally health method to control of this disease. For this purpose, 293 wheat genotypes of Advanced Regional Wheat Yield Trial (ARWYT) -North-Moderate-South-Cold and Elite Regional Wheat Yield Trial (ERWYT) -N-M-S-C were evaluated to septoria leaf blotch at field conditions and under mist irrigation during 2006-2007 in Gargan and Dezful. Each line was planted in 2 rows of 1 m long and spaced 30 em apart. Lines were inoculated artificially several times by spreading infected leaves and spraying with spores suspention. The evaluation was carried out based on Sarri and Prescott method modified by Eyal et a!. and on 00-99 scale. The results showed that in, Gargan, septaria leaf blotch was settled and genotypes had infected well. So that from 178 genotypes of ARWYT, 136 lines were susceptible, 31 lines were moderately susceptible and 11 lines were immune. Th~ evaluation of genotypes of ER WYT showed that ITom 115 genotypes, 66 Hnes were susceptible, 20 lines were moderately susceptible and 24 lines were immune. In Dezful , septoria leaf blotch was not settled and genotypes were not infected properly. So the genotypes did not showe correct reactions to infections and their evaluation were not reliable. In greenhouse, the infection process was not successful due to a system fault which caused a drop in temperature and humidity. Therefore the seedlings could not be avaluated.