مشخصه­ های ساختاری سطح پوشش­ های TiSiCN و TiSiN به روش رسوب فیزیکی بخار قوس کاتدی

مراجع و منابع این مقاله:

• D. M. Mattox, Handbook of Physical Vapor Deposition (PVD) Processing, ...
• D. M. Mattox, Handbook of Physical Vapor Deposition (PVD) Processing ...
• E. Bemporad, M. Sebastiani, D. Defelicis, V. Mangione, F. Carassiti, ...
• M. Tkadletz, C. Mitterer, B. Sartory, I. LetofskyPapst, C. Czettl, ...
• P. Panjan, M. Cekada, M. Panjan, D. Kek-Merl, Growth defects ...
• N. Petkov, T. Bakalova, T. Cholakova, H. Bahchedzhiev, P. Louda, ...
• A. Anders, Macroparticles in Cathodic Arcs: From Fractal Spots to ...
• I. Brown, Pulsed Arc Sources, in: R.L. Boxman, P.J. Martin, ...
• M. Sebastiani, M. Piccoli, E. Bemporad, Effect of micro-droplets on ...
• G. T. P. Azar, C. Yelkarasi, M. Urgen, The role ...
• Lin, J., Wei, R., Bitsis, D.C., and Lee, P.M., Development ...
• Dobrzański, L., Śliwa, A., Żukowska, L., Mikuła, J., and Gołombek, ...
• Xie, Z.-w., Wang, L.-p., Wang, X.-f., Huang, L., Yang, L., ...
• Bouzakis, K.-D., Skordaris, G., Gerardis, S., Katirtzoglou, G., Makrimallakis, S., ...
• صرامی، ن، ابراهیم زاده، ا، اشرفی زاده، ف، "مطالعه فازی ...
• Lesage, J., Pertuz, A., Puchi-Cabrera, E., and Chicot, D., A ...
• Iost, A., Guillemot, G., Rudermann, Y., and Bigerelle, M., A ...
• Jönsson, B. and Hogmark, S., Hardness measurements of thin films, ...
• Chicot, D. and Lesage, J., Absolute hardness of films and ...
• Korsunsky, A., McGurk, M., Bull, S., and Page, T., on ...
• Puchi-Cabrera, E., Berrıos, J., and Teer, D., on the computation ...
• Thangavel, E., Lee, S., Nam, K.-S., Kim, J.-K., and Kim, ...
• Johnson, L., Rogström, L., Johansson, M., Odén, M., and Hultman, ...
• Wang, Y., Li, J., Dang, C., and Zhu, Y., Influence ...
• Abraham, S., Choi, E.Y., Kang, N., and Kim, K.H., Microstructure ...
• Xu, H., Nie, X., and Wei, R., Tribological behavior of ...
• Li, J., Wang, Y., Yao, Y., Wang, Y., and Wang, ...
• Endler, I., Höhn, M., Schmidt, J., Scholz, S., Herrmann, M., ...
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