مقایسه روش های تعیین موقعیت پیک های انعکاس در روش استاندارد پراش اشعه ایکس

مراجع و منابع این مقاله:

• new Cu Kd, - Aءه [13] C. Dong, H. Chen, ...
• Paul S. Prevey, "X-ray Diffraction Residual Stress Techiques", Metals Handbook. ...
• M.E. Fitzpatrick, A.T. Fry, P. Holdway, F.A. Kandil, J. Shackleton ...
• Measuremet Good Practice Guide No. 52", National Physical Laboratory, 2005. ...
• A.H. Jones, and Q. Luo, "high-precision determination of residual stress ...
• B.D. Cullity, and S.R. Stock, "Elements of X-ray Diffraction", _ ...
• H.M. Rietveld, "A profile refinement method for nuclear and magnetic ...
• T. Ida, M. Ando, and H. Toraya, "Extended pseudo- Voigt ...
• _ _ _ Cryst., Vol. 10, p. 66, 1977. ...
• D.P. Koistinen, and R.E. Marburger, "Simplified Procedure for Calculating Peak ...
• V.M. Hauk, and E. Macherauch, "A Jseful Guide for X-Ray ...
• E. Rossmanith, "Relationship Between Lorentz Factor and Peak Width. Development ...
• D. K. Keating, Rev. Sci. Instrum., Vol. 30, pp. 725- ...
• W. A. Rachinger, J. Sci. Instrum., Vol. 25, pp. 254- ...
• L. Jiabao, and S. Yanjun, "Background analysis and its correction ...
• S. Enzo, and W. Parish, "A Method of Background Subtraction ...
نمایش کامل مراجع